Maptek Consolidates on Field Benefits for High Accuracy Survey-grade Sensors
A new dual-window scanner that halves data capture time headlines the latest Maptek mine measurement improvements. The new Maptek XR3-D mkII laser scanner with dual window arrangement cuts scan acquisition time in half. Conventional terrestrial laser scanners capture data from one window, spinning to achieve a 360° field of view; the XR3-D captures data from […]