Maptek Consolidates on Field Benefits for High Accuracy Survey-grade Sensors

fall2021tools03

A new dual-window scanner that halves data capture time headlines the latest Maptek mine measurement improvements. The new Maptek XR3-D mkII laser scanner with dual window arrangement cuts scan acquisition time in half. Conventional terrestrial laser scanners capture data from one window, spinning to achieve a 360° field of view; the XR3-D captures data from […]

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