Maptek Consolidates on Field Benefits for High Accuracy Survey-grade Sensors
A new dual-window scanner that halves data capture time headlines the latest Maptek mine measurement improvements. The new Maptek XR3-D mkII laser scanner with dual window arrangement cuts scan acquisition time in half. Conventional terrestrial laser scanners capture data from one window, spinning to achieve a 360° field of view; the XR3-D captures data from both sides simultaneously, with the scanner head only needing to spin 180°.
“Survey crews can incidentally scan surrounding terrain in both directions while they’re on their way to capture highwall and stockpile data,” says Jason Richards, Global Product Strategy Manager for Maptek. “There’s no need to return to the pit later, as the haul roads, gradients, and infrastructure have already been acquired seamlessly.”
Hardware models in the new R3 mkII series include the extra long-range XR3 (standard and cold climate configurations), the SR3 for short-range underground applications, and the new XR3-D.
Maptek sensing systems are renowned for safety and ease of use for daily survey, with software tools providing integrated decision support.